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Advancements and challenges in development of atomic force microscopy for nanofabrication

Paper ID Volume ID Publish Year Pages File Format Full-Text
32212 44910 2011 17 PDF Available
Title
Advancements and challenges in development of atomic force microscopy for nanofabrication
Abstract

SummaryIn the past decade, atomic force microscopy (AFM) has become a powerful technology for nanofabrication due to its low cost, simplicity in operation, and unique atomic-level manipulation capabilities. Although a wide range of nanoscale components, devices, and systems have been fabricated by AFM, three major challenges in the further enhancement of its capability, reliability and productivity are still remaining in AFM nanofabrication. In this paper, following an overview of the recent advances in AFM nanofabrication technology, the recent efforts made to cope with these challenges are examined and the potential challenges on further capability advancement, especially on those processes having tips loaded with multiple energy sources, are discussed. Then, specific approaches for improving the repeatability by equipment automation and for enhancing its throughput or productivity by parallel processing and speed increasing are evaluated and the potential improvements are suggested. Finally, concluding remarks summarizing the major challenges and the potential solutions in AFM fabrication are included.

Graphical abstractFigure optionsDownload full-size imageDownload high-quality image (133 K)Download as PowerPoint slideHighlights► The extensive efforts and the associated technological advances in three major challenge areas: capability, reliability and productivity, in the development of AFM for nanofabrication are reviewed. ► The potential challenges on capability advancement, especially on those techniques having tips loaded with multiple energy sources are discussed. ► Specific approaches for improving the reliability by automation and for enhancing its productivity by parallel processing and speed increasing are specifically evaluated and potential improvements are suggested.

Keywords
Atomic force microscopy; Multiple probes; Multiple energy sources; Nanofabrication; Parallel processing; Throughput
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Advancements and challenges in development of atomic force microscopy for nanofabrication
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Publisher
Database: Elsevier - ScienceDirect
Journal: - Volume 6, Issue 5, October 2011, Pages 493–509
Authors
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Subjects
Physical Sciences and Engineering Chemical Engineering Bioengineering
Get Full-Text Now
Don't Miss Today's Special Offer
Price was $35.95
You save - $31
Price after discount Only $4.95
100% Money Back Guarantee
Full-text PDF Download
Online Support
Any Questions? feel free to contact us