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A new approach for the classification of event related potentials for valid and paradox reasoning

Paper ID Volume ID Publish Year Pages File Format Full-Text
5131 341 2016 10 PDF Available
Title
A new approach for the classification of event related potentials for valid and paradox reasoning
Abstract

In the present paper, a novel approach is introduced for comparing and classifying recorded ERP signals from subjects applying valid (Aristotle's) and paradox (Zeno's) syllogisms. In fact, the authors conceived and realized a corresponding experiment, as well as a new method for processing, fitting and classifying the corresponding captured ERP signals into groups according to their similarity. Subsequently, for each such group, an ideal curve that represents all signals of the group has been evaluated for valid and paradox reasoning separately. These “ideal representatives” manifest essential statistical differences per subject for a considerable number of electrodes (5 electrodes with 99% level of confidence, 14 electrodes with 95% level of confidence, 17 electrodes with 90% level of confidence). These results support the assumption that the obtained ideal representatives may indeed reflect essential differences in the underlying brain functions which generated the obtained ERPs. Equivalently, one may claim that the performed experiment and the associated results manifest statistically essential differences between the mental functions during valid and paradox reasoning.

Keywords
Event related potentials (ERPs); Curve fitting; Valid reasoning; Paradox syllogism; Aristotle's reasoning; Zeno's paradoxes
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Publisher
Database: Elsevier - ScienceDirect
Journal: Biocybernetics and Biomedical Engineering - Volume 36, Issue 1, 2016, Pages 292–301
Authors
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Subjects
Physical Sciences and Engineering Chemical Engineering Bioengineering
Get Full-Text Now
Don't Miss Today's Special Offer
Price was $35.95
You save - $31
Price after discount Only $4.95
100% Money Back Guarantee
Full-text PDF Download
Online Support
Any Questions? feel free to contact us