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Investigation of ceria by combined Raman, UV–vis and X-ray photoelectron spectroscopy

Paper ID Volume ID Publish Year Pages File Format Full-Text
51376 46841 2012 4 PDF Available
Title
Investigation of ceria by combined Raman, UV–vis and X-ray photoelectron spectroscopy
Abstract

Surface and bulk oxygen vacancy defects in ceria powder samples were investigated by Raman, UV–vis and X-ray photoelectron spectroscopy combined in one experimental setup for the first time. Analysis of surface reduction (defects) is based on changes in Ce3d photoemission lines. For ceria reduced by X-ray exposure UV–vis spectra reveal an electronic transition at around 500 nm. The nature of the defects is specified by the presence of peroxide and hydroxy Raman bands at 832 cm− 1 and 3664 cm− 1. Our results demonstrate the potential of a combined spectroscopic approach for characterization of defects located at the surface and in the bulk of ceria.

Graphical abstractFigure optionsDownload full-size imageDownload as PowerPoint slideHighlights► Surface and bulk defects in ceria powder studied by multiple in situ spectroscopy. ► Surface defects quantified by analysis of Ce3d photoemission. ► Surface/bulk defects characterized by Vis absorption and peroxy/hydroxy Raman bands. ► Complementary information on ceria defects by combined Raman/UV–Vis/XPS.

Keywords
Ceria; Defects; In situ spectroscopy
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Investigation of ceria by combined Raman, UV–vis and X-ray photoelectron spectroscopy
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Publisher
Database: Elsevier - ScienceDirect
Journal: Catalysis Communications - Volume 22, 10 May 2012, Pages 39–42
Authors
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Subjects
Physical Sciences and Engineering Chemical Engineering Catalysis
Get Full-Text Now
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Price was $35.95
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